beamLIGHT
in-line XUV spectrometer
in-situ spectrometer with beam bypass
no-slit design for highest efficiency and robustness
compact footprint for tight beamline space
full automation for remote control
additional characterization options
For in-situ source characterization in a beamline, beamLIGHT is the perfect choice. It integrates the proprietary no-slit spectrometer in a compact footprint (50cm length). Day-to-day operation robustness is greatly increased by this architecture. beamLIGHT combines highest spectrometer efficiency with aberration-corrected flat-field coverage and automated beam bypass switching.
The modular design matches a variety of experimental geometries and configurations. Both standard and ultra-high vacuum versions are available. Beam diagnostics such as a beamprofiler or wavefront sensor can be incorporated.
Detector options include both XUV CCDs and multi-channel plate assemblies.
Full customized beamline setups with in-line spectrometers are also available. Please contact us to discuss your requirements.
Applications
High-harmonic generation sources
Attosecond science
Intense laser-matter interaction
Laser and discharge produced plasma sources
Synchrotron beamline characterization
Free-electron lasers
X-ray lasers
Laser-driven secondary sources
Downloads
beamLIGHT: in-line XUV spectrometer specifications
