A multi-chip high-resolution large-area spectral scanner, enabling accurate material identification and superior image contrast. Suitable for industrial applications such as Computer tomography. Hardware integration of TDI mode.
Our largest hi-resolution industrial spectral camera is equipped with a Medipix3 read-out chip
The large area imaging detector WidePIX L 2(1)x15 – MPX3 with a resolution of 512 (256) x 3840 pixels is composed of Medipix3 hybrid detector electronics tiles. Each tile (256 x 256 pixels) is attached to a silicon or CdTe sensor. Therefore, the whole area of the device is fully sensitive, and there are no gaps between sensor tiles.
Each pixel has two integrated 12-bit digital counters and two energy discrimination thresholds. The counters store number of registered particles, e.g., X-ray photons, with energy above the appropriate threshold. Both counters can be joined to a single 24-bit counter, providing an enhanced dynamic range. The particle counting principle eliminates any additional noise generated by the sensor or electronic readout. It allows for acquiring X-ray images with high contrast and wide dynamic range. Therefore, even low-contrast structures such as plastic or soft tissue are easily detectable in X-ray images.
WidePIX 2(1)x5 – MPX3 camera consists of either 2×5 or 1×5 Medipix3 devices. Both devices are suitable for CT scanners, which can take advantage of large sensitive areas without any gaps. Moreover, the WidePIX 1×15 – MPX3 variant supports a hardware-based Time-Delayed-Integration mode for online (continuous) scanning applications.
The energy discrimination thresholds of Medipix3 technology allow spectral X-ray imaging. Different materials in an inspected sample could then be identified based on spectral X-ray attenuation properties. Energy spectra could be measured typically from 5 keV upwards.
The Charge Summing Mode implemented in the pixel electronics provides hardware-based correction of signal cross-talk between pixels. This further considerably improves the detector spectral response and the quality of spectra measured in individual pixels.
The camera is connected to a computer via three ethernet cables.
Specifications
Readout chip type
Timepix3
Interface
3x RJ45 1Gbit/s Ethernet
Pixel size
55 x 55 μm
Resolution
9 lp/mm
Sensor resolutionsize
512(256) x 3840 pixels
Pixel mode of operation
Counting in Single Pixel Mode (SPM) or Charge Summing Mode (CSM)
Time-Delayed-Integration
Integration Yes, hardware based (for 1×5 tiles variant)
Min Detectable Energy
4 KeV (Si) and 5 KeV (CdTe)
Counter bit depth
12 or 24 bits (configurable)
Effect Area
28(14) x 211,2 mm
Readout speed
50 (1×15 tiles) and 20 (2×15 tiles) frames/s
Thresholds per pixel
1 or 2
Threshold step resolution
0.1 KeV
Energy resolution
0.7-2.0 keV (Si) and 1.2-3.6 (CdTe)
Sensor material
300 μm for Si or 1 mm for CdTe
Dimensions
213 mm x 60 mm x 40 mm
Weight
3800 g
Software
PIXET PRO
WidePIX L 2(1)x15 MPX3 Datasheet
WidePIX(L) & MPX3 User Manual
PIXet Manual
Imaging Application
NON DESTRUCTIVE TESTING
Experience the power of our advanced cameras, delivering unmatched sensitivity, spatial resolution, and contrast. Our single-photon counting Cameras quickly uncover hidden details in various materials, from light composites to thick welded parts. The technology suppresses scattered radiation, capturing quality images in record time. The capabilities of our photon-counting X-ray imaging unveil internal material structures and spot defects like porosity, fiber orientation, micro-cracks, and delaminations with unparalleled precision. Elevate your NDT with our industry-leading solutions, setting new standards in defect detection.
MATERIAL ANALYSIS
Do you need to determine the material composition of your sample? Minerals, alloys, polymers, electronics, batteries, or pigments? Our cameras are based on cutting-edge single X-ray photon counting sensors, and each detected photon is processed individually. This approach also allows measuring the wavelength of photons. It brings unprecedented image quality and new possibilities, such as material-sensitive X-ray imaging. Moreover, our detectors enable fast and compact X-Ray Diffraction (XRD) and Crystallography solutions. XRD sample analysis is performed up to an order of magnitude faster than conventional systems. Spectral sensitivity provides a unique ability to inspect the sample surface and its interior (Energy dispersive XRD).
BIOMEDICAL
Cancer research, bio-mechanics, and drug testing are just a few examples of X-ray imaging contributing to biology and medicine research. New photon-counting detectors represent a severe advancement to these applications compared to previously used methods. The energy sensitivity of modern cameras opens better possibilities for identifying individual types of tissue and contrast agents. That has significant consequences in various industries, for example, cancer research, where the tumor tissue can be better distinguished from the healthy one.
